ZHANG, Jiexi. Line-Focused Laser and YOLOv5-Based High-Precision Defect Detection for Reflective Surfaces. Informatica, [S. l.], v. 49, n. 13, 2025. DOI: 10.31449/inf.v49i13.7556. Disponível em: https://www.informatica.si/index.php/informatica/article/view/7556. Acesso em: 10 jan. 2026.